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 Agilent E6835A TD-SCDMA Calibration Application
For the E6601A Wireless Communications Test Set Data Sheet
The next generation of mobile phone manufacturing test.
The E6601A is the newest test set from Agilent Technologies, designed especially for high-volume, test-mode manufacturing. Combining industry-leading measurement speed, selectable formats, flexible licensing, and an integrated open Windows (R) XP PC, the E6601A helps you achieve the lowest cost of test in mobile phone manufacturing. The E6601A and its available technology-specific software applications deliver industry leading measurement speed and accuracy for your mobile phone test needs. The Agilent E6835A TD-SCDMA Calibration Application is a non-signaling application optimized for TD-SCDMA user equipment calibration. The E6835A also provides a choice of perpetual, transportable, or term licenses for maximizing asset utilization and your cost per test. Because it's Agilent, you can be confident--it operates using trusted, proven measurement methodology that ensures measurement integrity that is never compromised.
E6601A Features
* * * * * * * * * * * * CW, AM, FM, DSB-SC source modulation RF analyzer Spectrum monitor Transmitter power measurements Power versus time measurement Frequency error measurement Optional IQ capture waveform sampling Internal OCXO time base Built-in open Windows XP PC Built-in help system Run test programs with internal or external PC GPIB, USB, and LAN connectivity and control
E6835A Features
Source modulation
* CW, AM, FM, DSB-SC source modulation * TD-SCDMA source modulation
Power measurements
* Mean power * Root-raised cosine (RRC) filtered mean power
Spectral measurements
* Adjacent channel leakage ratio (ACLR) * Spectrum emission mask (SEM) * Spectrum monitor
Modulation quality
* * * * CW frequency error DPCH error vector magnitude (EVM) DPCH peak code domain error (PCDE) DPCH frequency error
Dynamic power measurement
Technical Specifications
These specifications apply to an Agilent E6601A Wireless Communications Test Set mainframe and the E6835A TD-SCDMA Calibration Application firmware revision A.05 or higher. Only feature additions beyond the Agilent E6890A General Purpose Application are included in this document. Specifications describe the test set's warranted performance and are valid for the unit's operation within 10 C of the last self alignment. All specifications are valid after a 30-minute warm-up period of continuous operation with valid self alignment. If the instrument has been off for longer than 48 hours, a 48-hour warm-up period followed by self alignment is required. Supplemental characteristics are intended to provide typical, but non-warranted, performance parameters that may be useful in applying the instrument. These characteristics are shown in italics and labeled as "typical." All units shipped from the factory meet these typical numbers at +25 C ambient temperature without including measurement uncertainty.
DPCH Measurement Suite
Includes mean power, RRC filtered mean power, ACLR, EVM, frequency error, PCDE, and SEM measurements. Trigger setup Delay Sources -20 to +20 ms External, immediate, RF rise
Mean and RRC-filtered mean power measurements
Input level range Average power -65 to +28 dBm/1.28 MHz Measurement accuracy -61 to +28 dBm/1.28 MHz < 0.65 dB, typically < 0.3 dB With < 48 hours warm-up before self alignment initiated -61 to +28 dBm/1.28 MHz < 0.8 dB, typically < 0.3 dB Measurement repeatability Typically < 0.05 dB Filter Mean power Mean power-compliant filter RRC-filtered mean power 1.28 MHz
RF Generator
Frequency
Frequency range TD-SCDMA cellular bands 380 to 2700 MHz 2010 to 2025 MHz
Adjacent channel leakage ratio (ACLR) measurement
This measurement provides a ratio of the RRC filtered mean power centered on an adjacent channel to the RRC filtered mean power centered on the assigned channel frequency. The RRC filter has an RRC response with roll-off = 0.22 and a bandwidth equal to the chip rate. Input level range Average power Measurement accuracy 1.6 MHz offsets at -33 dB 3.2 MHz offsets at -43 dB Residual noise floor 1.6 MHz offsets 3.2 MHz offsets Filter +5 to +28 dBm/1.28 MHz < 0.8 dB, typically < 0.4 dB < 0.8 dB, typically < 0.4 dB Typically < -53 dBc Typically < -63 dBc 1.28 MHz (RRC)
Output level
Output level ranges RF IN/OUT port -120 to -15 dBm/1.28 MHz RF OUT ONLY port -120 to -5 dBm/1.28 MHz Composite signal absolute level accuracy < 10 C and < 24 hours from last self alignment RF IN/OUT port -108 to -28 dBm/1.28 MHz < 1 dB, typically < 0.45 dB -28 to -15 dBm/1.28 MHz < 1 dB, typically < 0.39 dB RF OUT ONLY port -108 to -28 dBm/1.28 MHz < 1 dB, typically < 0.45 dB -28 to -5 dBm/1.28 MHz < 1 dB, typically < 0.39 dB QPSK modulation Residual EVM Typically < 2.5% (rms)
Spectrum emission mask (SEM) measurement
This measurement provides the out of channel emission for the offset frequencies, which are between 0.8 and 4 MHz away from the UE carrier frequency. The out of channel emission is specified relative to the RRC filtered mean power of the UE carrier. The RRC filter has an RRC response with roll-off = 0.22 and a bandwidth equal to the chip rate. Input level range Average power +5 to +28 dBm/1.28 MHz Measurement accuracy (0.8 to 4.0) MHz < 1.5 dB Filter In band 1.28 MHz (RRC) 0.8 to 2.4 MHz 30 kHz (Gaussian) 2.4 to 4.0 MHz 1 MHz (Gaussian) Measurement results Pass/fail, in-channel power (dBm/1.28 MHz), average power level relative to in-channel power for each offset range (dBc), the power level vectors relative to in-channel power for all points tested in each offset range, as well as the worst case results
RF Analyzer
Frequency
Frequency range TD-SCDMA cellular bands Input level ranges Average power Peak power Self alignment validity 380 to 2700 MHz 2010 to 2025 MHz -65 to +28 dBm/1.28 MHz -65 to +37 dBm/1.28 MHz (5 W) 10 C change and 30 days from last self alignment
2
Error vector magnitude (EVM) measurement
This measurement calculates composite EVM and several other results relating to UE modulation quality. Input level range Average power UE ranges EVM Frequency error Timing error EVM measurement accuracy (Includes residual EVM) Filter Measurement results -25 to +28 dBm/1.28 MHz 20% rms < 20 kHz < 25 chips < 2.5% rms 1.28 MHz (RRC) EVM, magnitude error, phase error, origin offset
Dynamic Power Measurement
This measurement provides a fast and flexible method for calibrating the power accuracy of a wireless device by providing multiple Tx power measurements at a single frequency. It tracks and reports the power result for each step. To take advantage of this measurement capability, the wireless device must have a test mode that outputs an appropriate power ramp at each frequency with the expected number of steps and dwell time at each step (step length). Input level range Average power -65 to +28 dBm/1.28 MHz Amplitude capture range With 7 dB crest factor < 2 dB of expected power 1 Measurement accuracy +2 to -42 dB of expected power -54 to +28 dBm/1.28 MHz < 0.6 dB, typically < 0.3 dB -61 to < -54 dBm/1.28 MHz < 0.7 dB, typically < 0.4 dB +2 to -42 dB of expected power With < 48 hours warm-up before self alignment initiated -54 to +28 dBm/1.28 MHz < 0.7 dB, typically < 0.3 dB -61 to < -54 dBm/1.28 MHz < 0.8 dB, typically < 0.4 dB Measurement repeatability Typically < 0.05 dB Trigger setup Sources External, fall, rise Step Length and Number of Steps parameters are coupled to the setting of the Filter:
Filter 1 kHz 30 kHz Step length (SL) 0.5 to 180 ms 0.25 to 180 ms 0.1 to 20 ms 0.1 to 20 ms 0.1 to 20 ms 0.1 to 20 ms 0.1 to 20 ms 0.1 to 20 ms 0.1 to 20 ms 0.1 to 20 ms 0.575 to 20 ms 0.1 to 20 ms 0.1 to 20 ms Number of steps 1 to (1048000/(21973 x SL)) 1 to (1048000/(60e3 x SL)) 1 to (1048000/(250e3 x SL)) 1 to (1048000/(600e3 x SL)) 1 to (1048000/(1.28e6 x SL)) 1 to (1048000/(2.46e6 x SL)) 1 to (1048000/(2.56e6 x SL)) 1 to (1048000/(3.2e6 x SL)) 0.1 to (1048000/(7.68e6 x SL)) 0.1 to (1048000/(10e6 x SL)) 1 to 1047800/(1.0833e6 x SL) 1 to (1048000/(320e3 x SL)) 1 to (1048000/(5.25e6 x SL))
Frequency error measurement
This measurement measures the difference between the carrier frequency transmitted from the UE and the expected frequency. The UE uses the same frequency source for both RF frequency generation and the chip clock. Input level range Average power UE ranges EVM Frequency error Timing error Measurement accuracy Filter Measurement results -25 to +28 dBm/1.28 MHz 20% rms < 20 kHz < 25 chips < (10 Hz + timebase accuracy) 1.28 MHz (RRC) Frequency error
Peak code domain error (PCDE) measurement
This measurement is computed by projecting power of the error vector onto the code domain at a specific spreading factor. The code domain error for every code in the domain is defined as the ratio of the mean power of the projection onto that code, to the mean power of the composite reference waveform. This ratio is expressed in dB. The PCDE is defined as the maximum value for the code domain error for all codes. Input level range Average power UE ranges EVM Frequency error Timing error Measurement accuracy Filter Measurement results -25 to +28 dBm/1.28 MHz 20% rms < 20 kHz < 25 chips < 0.3 dB 1.28 MHz (RRC) Maximum value of CDE
100 kHz 300 kHz 640 kHz 1.23 MHz 1.28 MHz 1.6 MHz 3.84 MHz 5.0 MHz 8PSK estimated carrier power GSM Tx power W-CDMA mean power)
Measurement result A graph displaying the discrete power at each power step along with numeric power results for each step
1. Additional accuracy error when using RF OUT ONLY port is < 0.1 dB.
3
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Product specifications and descriptions in this document subject to change without notice. (c) Agilent Technologies, Inc. 2007 Printed in USA, December 5, 2007 5989-7180EN


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